Transmissions Electron Microscopy Presentation

Title: Transmission Electron Microscopy - Current technology and future horizons

An overview of what is currently available from the TEM market leader and what is coming in the near future. JEOL hardware, application overview and solutions for life science and material science fields are introduced followed by Q&A.

The modern day TEM is one of the most powerful tools for micro-and nano-scale investigation in both material and biological science fields. Recent developments in TEM technology have seen the introduction of a new advanced STEM system, a Cold Field Emission Gun (CFEG), and aberration correction optics.

Further advancements have been made within the analytical instrument including an improved X-ray analysis system and the introduction a SDD (silicon drift detector) which is replacing the conventional Si-Li detector. Significant improvements have also been made within the energy resolution, the dynamic range of the count ratio and the S/N ratio.

Aberration corrected electron optics offers higher sensitivity electron energy-loss spectroscopy (EELS). With the combinations of the latest aberration corrected TEM/STEM and analytical instrument, atomic resolution imaging and elemental analysis is achieved. During the lecture examples of the latest application data will be introduced.

RSVP: Tuesday 27th of November to Richard.Wuhrer@uws.edu.au